Search results

Records found: 1  
Your query: Author Sysno/Doc.kind = "^sav_un_auth 0077178 xcla^"

  1. 1.Defect Oriented TPG for Combined IDDQ-Voltage Testing of Combinational Circuits.

    TitleDefect Oriented TPG for Combined IDDQ-Voltage Testing of Combinational Circuits.
    Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV
    Co-authors Bečková Jana 1966- SAVINFO - Ústav informatiky SAV
    Another authors Gašpar Ján SAVINFO - Ústav informatiky SAV
    Action EDDCC3 : 1999 : Praha, Czech Republic
    Source document EDCC3 Conference : Proc. of Fast Abstracts. - Praha, Czech Republic, 1999
    CategoryAFC - Published papers from foreign scientific conferences
    Year1999
    article

    article



  This site uses cookies to make them easier to browse. Learn more about how we use cookies.

Accept allSettingsReject all