Search results
Title Optical Characteristic Measuring Apparatus : Patent US 8 982 345 B2. (Assignee: National Institute of Advanced Industrial Science and Technology, Tokyo, Japan) Author Kawate E. Co-authors Hain Miroslav 1960 SAVMER - Ústav merania SAV Issue data United States Patent and Trademark Office , March 17, 2015 Category AGJ - Patent applications, utility model applications, design applications, trademark applications, applications for granting supplementary protection certificate, applications for registration of topographies of semiconductor products, designations of origin applications, geographical indications of goods and products applications, breeder's certificate applications Year 2016 File name Access Size Downloaded Type License Optical Characteristic Measuring Apparatus.pdf available 2 MB 2 Publisher's version 
book
Title Optical Characteristic Measurement Device : Patent WO 2012/121323 A1. (Assignee: National Institute of Advanced Industrial Science and Technology, Tokyo, Japan) Author Kawate E. Co-authors Hain Miroslav 1960 SAVMER - Ústav merania SAV Issue data Japan Patent Office , September 13, 2012 Category AGJ - Patent applications, utility model applications, design applications, trademark applications, applications for granting supplementary protection certificate, applications for registration of topographies of semiconductor products, designations of origin applications, geographical indications of goods and products applications, breeder's certificate applications Year 2012 book