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Title Effects of gate shaping and consequent process changes on AlGaN/GaN HEMT reliability Author Moereke J. Co-authors Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV Uren M.J. Pei Y. Mishra Umesh K. Kuball M. Source document Physica status solidi A. Applications and materials science. Vol. 209, (2013), p. 2646-2652 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2013 DOI 10.1002/pssa.201228395 
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Title Non-arrhenius degradation of AlGaN/GaN HEMTs grown on bulk GaN substrates Author Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV Co-authors Killat N. Moereke J. Paskova T. Evans Kevin R. Leach J. Li X. Ozgur U. Morkoc H. Chabak K.D. Crespo A. Gillespie J.K. Fitch R. Kossler M. Walker D.E. Trejo M. Via G.D. Blevins J.D. Kuball M. Source document IEEE Electron Devices Letters. Vol. 33, (2012), p. 1126-1128 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2012 DOI 10.1109/LED.2012.2199278 article