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Title Effects of gate shaping and consequent process changes on AlGaN/GaN HEMT reliability Author Moereke J. Co-authors Ťapajna Milan 1977 SAVELEK - Elektrotechnický ústav SAV Uren M.J. Pei Y. Mishra Umesh K. Kuball M. Source document Physica status solidi A. Applications and materials science. Vol. 209, (2013), p. 2646-2652 Category ADCA - Scientific papers in foreign journals registered in Current Contents Connect with IF (impacted) Category of document (from 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Type of document článok Year 2013 DOI 10.1002/pssa.201228395 
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