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Title Hierarchical defect-oriented fault simulation for digital circuits Author Blyzniuk M. Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Kuzmicz W. Lobur M. Pleskacz W. Raik J. Ubar R. Source document ETW 2000 - Informal Digest : IEEE European Test Workshop. P. 151-156 / Prinetto P. ; Teixiera J.P. ; Teixiera I.M.C. ; Flottes M.L.. - Los Alamitos : IEEE, 2000 Category AFC - Published papers from foreign scientific conferences Year 2000 
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Title ATPG for IDDQ and/or Voltage Testing of Combinational Circuits Using an Arbitrary Fault Library for Basic Gates Author Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Co-authors Cibáková Tatiana 1960- SAVINFO - Ústav informatiky SAV Gašpar Ján Mikloš P. Action ETW 2000 - IEEE European Test Workshop. Informal Digest : 23.-26.05. : Cascais, Portugalsko Issue data California, Los Alamitos : IEEE , 2000 Source document ETW 2000 - Informal Digest . P. 317-318 Category AFC - Published papers from foreign scientific conferences Year 2000 article