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Title Nanoscale analysis of defects in semiconductors and dielectrics by means of charge- transient spectroscopy/microscopy Author Lányi Štefan 1944 SAVFYZIK - Fyzikálny ústav SAV Co-authors Nádaždy Vojtech 1961 SAVFYZIK - Fyzikálny ústav SAV Hruškovic Miloslav Hribik Ján Source document Materials Research Society Symposium Proceedings : MRS Proceedings 1995-2008., Vol. 1025. - Warrendale : Materials Research Society, 2008 Category AFC - Published papers from foreign scientific conferences Year 2008 
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Title On determination of properties of ultrathin and very thin silicon oxide layers by FTIR and X-ray reflectivity Author Kopáni M. Co-authors Jergel Matej 1954- SAVFYZIK - Fyzikálny ústav SAV Kobayashi H. Takahashi M. Mikula M. Imamura K. Jurečka S. Pinčík Emil 1956 SAVFYZIK - Fyzikálny ústav SAV Source document Materials Research Society Symposium Proceedings : MRS Proceedings, Vol. 1066 . p. 199-204. - Warrendale : Materials Research Society, 2008 Category AFC - Published papers from foreign scientific conferences Year 2008 article