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Title Memory testing and self-repair. Chapter 7 Document part Chapter 7 Author Fischerová Mária 1955- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- Source document / Ubar Raimund ; Raik J. ; Vierhaus Heinrich T. Design and test technology for dependable systems-on-chip. P. 155-174. - New York : Information Science Reference, 2011 Category ABC - Chapters in scientific monographs published abroad Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document kapitola Year 2011 
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Title Delay faults testing Author Baláž Marcel 1979- SAVINFO - Ústav informatiky SAV Co-authors Dobai Roland 1983- SAVINFO - Ústav informatiky SAV Gramatová Elena 1949- Source document / Ubar Raimund ; Raik J. ; Vierhaus Heinrich T. Design and test technology for dependable systems-on-chip. P. 377-394. - New York : Information Science Reference, 2011 Category ABC - Chapters in scientific monographs published abroad Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document kapitola Year 2011 article