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Title 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : 13th IEEE DDECS 2010 Another authors Kotásek Zdeněk Steininger Andreas Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Zimmermann Horst Armengaud Eric Vierhaus Heinrich T. Függer Matthias Lechner Jakob Action IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. IEEE DDECS 2010 ( 13th : April 14-16, 2010 : Vienna ) Issue data Vienna : Institute of Electrical and Electronics Engineers , 2010. - 407 p. Category FAI - Editorial work on book publications (bibliographies, encyclopedias, catalogues, dictionaries, collective publications/proceedings, atlases ...) Year 2010 References (1) Publication Activity of SAV - Articles 
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Title Test pattern generation for the combinational representation of asynchronous circuits Author Dobai Roland 1983- SAVINFO - Ústav informatiky SAV Co-authors Gramatová Elena 1949- SAVINFO - Ústav informatiky SAV Source document / Kotásek Zdeněk ; Steininger Andreas ; Gramatová Elena 1949- ; Zimmermann Horst ; Armengaud Eric ; Vierhaus Heinrich T. ; Függer Matthias ; Lechner Jakob 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : 13th IEEE DDECS 2010. P. 323-328. - Vienna : Institute of Electrical and Electronics Engineers, 2010 ; IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems IEEE DDECS 2010 Category AEC - Scientific papers in foreign peer-reviewed proceedings, monographs Category of document (from 2022) V2 - Vedecký výstup publikačnej činnosti ako časť editovanej knihy alebo zborníka Type of document príspevok Year 2010 DOI 10.1109/DDECS.2010.5491759 
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