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Your query: All Fields = "The 45th International Conference on Electron Ion and Photo Beam Technology and Nanofabrication"
  1. Title35uM thick high-resolution silicon stencil mask: Fabrication and operation in high energy ion projection and 10xdemagnification ion projection lithography
    Author Rangelow I.W.
    Co-authors Sossna E.
    Volland B.
    Shi F.
    Meijer J.
    Stephan A.
    Weidenmuller U.
    Bukow H.H.
    Rolfs C.
    Ngo Vinh Van
    Leung K.N.
    Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV
    Matay Ladislav 1950- SAVINFO - Ústav informatiky SAV
    Action The 45th International Conference on Electron, Ion and Photo Beam Technology and Nanofabrication. EIPBN 2001 ( 45th : May 29-June 1, 2001 : Washington, DC )
    Source document The 45th International Conference on Electron, Ion and Photo Beam Technology and Nanofabrication : EIPBN 2001. Abstracts. P. 96-97. - Washington, DC, USA, 2001
    CategoryAFG - Abstracts of papers from foreign conferences
    Year2001
    article

    article

  2. TitleThe 45th International Conference on Electron, Ion and Photo Beam Technology and Nanofabrication : EIPBN 2001. Abstracts
    Issue dataWashington, DC, USA , 2001. - 426 P.
    CategoryAAA - Scientific monographs published abroad
    Category of document (from 2022)V1 - Vedecký výstup publikačnej činnosti ako celok
    Type of documentmonografia
    Year2001
    References (1) Publication Activity of SAV - Articles
    book

    book



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