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All Fields = "The 45th International Conference on Electron Ion and Photo Beam Technology and Nanofabrication"
Title 35uM thick high-resolution silicon stencil mask: Fabrication and operation in high energy ion projection and 10xdemagnification ion projection lithography Author Rangelow I.W. Co-authors Sossna E. Volland B. Shi F. Meijer J. Stephan A. Weidenmuller U. Bukow H.H. Rolfs C. Ngo Vinh Van Leung K.N. Kostič Ivan 1955- SAVINFO - Ústav informatiky SAV Matay Ladislav 1950- SAVINFO - Ústav informatiky SAV Action The 45th International Conference on Electron, Ion and Photo Beam Technology and Nanofabrication. EIPBN 2001 ( 45th : May 29-June 1, 2001 : Washington, DC ) Source document The 45th International Conference on Electron, Ion and Photo Beam Technology and Nanofabrication : EIPBN 2001. Abstracts. P. 96-97. - Washington, DC, USA, 2001 Category AFG - Abstracts of papers from foreign conferences Year 2001 Title The 45th International Conference on Electron, Ion and Photo Beam Technology and Nanofabrication : EIPBN 2001. Abstracts Issue data Washington, DC, USA , 2001. - 426 P. Category AAA - Scientific monographs published abroad Category of document (from 2022) V1 - Vedecký výstup publikačnej činnosti ako celok Type of document monografia Year 2001 References (1) Publication Activity of SAV - Articles