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IEEE Transactions on Device and Materials Reliability

Názov	IEEE Transactions on Device and Materials Reliability. [seriál]
Krajina	SK - Slovenská republika
Druh dok.	B
Odkazy	(1) Publikačná činnosť SAV - články

časopis

rok	CC	IF	IF Q (best)	JCR Av Jour IF Perc	SJR	SJR Q (best)	CiteScore
2005		1.044	2	57.207	0.9	Q1
2006		1.373	1	67.097	1.012	Q1
2007		1.610	1	71.407	0.93	Q1
2008		1.278	2	52.262	0.906	Q1
2009	A	1.947	1	77.298	0.931	Q1
2010	A	1.503	2	63.926	0.777	Q1
2011	A	1.543	2	63.592	1.007	Q1	2.34
2012	A	1.516	2	60.543	0.831	Q1	1.89
2013	A	1.544	2	57.602	0.777	Q1	1.84
2014	A	1.890	2	68.016	0.825	Q1	2.26
2015	A	1.437	2	49.320	0.729	Q1	2.16
2016	A	1.575	3	45.609	0.444	Q2	1.78
2017	A	1.512	3	39.788	0.44	Q2	1.99
2018	A	1.583	3	36.363	0.381	Q2	1.75
2019	A	1.407	3	28.224	0.416	Q2	3.3
2020	A	1.761	3	31.494	0.384	Q2	3.5
2021	A	1.886	3	31.405	0.458	Q2	3.9
2022	A	2	3	32.5	0.401	Q2	4.3
2023		2.5	2	52.5	0.436	Q2
2024

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