Počet záznamov: 1  

Interplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field

  1. NázovInterplay of the tip-sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field
    Autor Such B. Turanský Robert 1971 SAVFYZIK - Fyzikálny ústav SAV

    Brndiar Ján 1980 SAVFYZIK - Fyzikálny ústav SAV    RID    ORCID

    Štich Ivan 1959 SAVFYZIK - Fyzikálny ústav SAV    ORCID

    Spoluautori Glatzel T. Kawai S. Meyer E.
    Zdroj.dok. Nanotechnology. Vol. 23, no. 4 (2012), 045705
    Jazyk dok.eng - angličtina
    Druh dok.rozpis článkov z periodík (rbx)
    OhlasyBAYKARA, Mehmet Z. - DAGDEVIREN, Omur E. - SCHWENDEMANN, Todd C. - MOENIG, Harry - ALTMAN, Eric I. - SCHWARZ, Udo D. Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, vol.3, p. 637-650.
    MAJZIK, Z. - TCHALALA, M. Rachid - SVEC, M. - HAPALA, P. - ENRIQUEZ, H. - KARA, A. - MAYNE, A. J. - DUJARDIN, G. - JELINEK, P. - OUGHADDOU, H. Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface. In JOURNAL OF PHYSICS-CONDENSED MATTER. ISSN 0953-8984, 2013, vol. 25, no. 22, 225301.
    JARVIS, Samuel Paul - KANTOROVICH, Lev - MORIARTY, Philip. Structural development and energy dissipation in simulated silicon apices. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2013, vol. 4, pp. 941-948.
    SWEETMAN, Adam - STANNARD, Andrew. Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2014, vol. 5, pp. 386-393.
    KUHN, Stefan - RAHE, Philipp. Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy. In PHYSICAL REVIEW B. ISSN 1098-0121, 2014, vol. 89, no. 23, 235417.
    YIN, Feng - KOSKINEN, Pekka - KULJU, Sampo - AKOLA, Jaakko - PALMER, Richard E. Real-space Wigner-Seitz Cells Imaging of Potassium on Graphite via Elastic Atomic Manipulation. In SCIENTIFIC REPORTS. ISSN 2045-2322, 2015, vol. 5, 8276.
    KIM, Howon - HASEGAWA, Yukio. Site-Dependent Evolution of Electrical Conductance from Tunneling to Atomic Point Contact. In PHYSICAL REVIEW LETTERS. ISSN 0031-9007, 2015, vol. 114, no. 20, 206801.
    BEYER, Hannes - KORY, Max J. - HOFER, Gregor - STEMMER, Andreas - SCHLUTER, A. Dieter. Exfoliation of two-dimensional polymer single crystals into thin sheets and investigations of their surface structure by high-resolution atomic force microscopy. In NANOSCALE. ISSN 2040-3364, 2017, vol. 9, no. 27, pp. 9481-9490.
    XIE, Fangqing - KAVALENKA, Maryna N. - ROEGER, Moritz - ALBRECHT, Daniel - HOELSCHER, Hendrik - LEUTHOLD, Jurgen - SCHIMMEL, Thomas. Copper atomic-scale transistors. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2017, vol. 8, pp. 530-538.
    DAGDEVIREN, Omur E. - SCHWARZ, Udo D. Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance. In REVIEW OF SCIENTIFIC INSTRUMENTS. ISSN 0034-6748, 2019, vol. 90, no. 3, 033707.
    LIEBIG, A. - PERONIO, A. - MEUER, D. - WEYMOUTH, A. J. - GIESSIBL, F. J. High-precision atomic force microscopy with atomically-characterized tips. In NEW JOURNAL OF PHYSICS. ISSN 1367-2630, 2020, vol. 22, no. 6, 063040.
    DAGDEVIREN, Omur E. Confronting interatomic force measurements. In REVIEW OF SCIENTIFIC INSTRUMENTS. ISSN 0034-6748, 2021, vol. 92, no. 6, 063703. Dostupné na: https://doi.org/10.1063/5.0052126.
    KategóriaADCA - Vedecké práce v zahraničných karentovaných časopisoch impaktovaných
    Kategória (od 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Typ výstupučlánok
    Rok vykazovania2012
    Registrované vWOS
    Registrované vSCOPUS
    Registrované vCCC
    DOI 10.1088/0957-4484/23/4/045705
    článok

    článok

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201220113.979Q11.899Q1
Počet záznamov: 1  

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