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Reliable determination of the few-layer graphene oxide thickness using Raman spectroscopy
Názov Reliable determination of the few-layer graphene oxide thickness using Raman spectroscopy Autor Kostiuk Dmytro 1976 SAVFYZIK - Fyzikálny ústav SAV Spoluautori Bodik Michal 1992 SAVFYZIK - Fyzikálny ústav SAV SCOPUS ORCID Šiffalovič Peter 1975 SAVFYZIK - Fyzikálny ústav SAV ORCID Jergel Matej 1954- SAVFYZIK - Fyzikálny ústav SAV SCOPUS RID ORCID Halahovets Yuriy 1982- SAVFYZIK - Fyzikálny ústav SAV Hodas Martin 1986 SAVFYZIK - Fyzikálny ústav SAV Pelletta Marco 1988 SAVFYZIK - Fyzikálny ústav SAV Pelach Michal 1987 SAVFYZIK - Fyzikálny ústav SAV Hulman Martin 1967 SAVELEK - Elektrotechnický ústav SAV ORCID Špitálsky Zdenko 1974- SAVPOLYM - Ústav polymérov SAV ORCID Omastová Mária 1962- SAVPOLYM - Ústav polymérov SAV ORCID Majková Eva 1950 SAVFYZIK - Fyzikálny ústav SAV ORCID Zdroj.dok. Journal of Raman Spectroscopy. 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Názov súboru Prístup Veľkosť Stiahnuté Typ Licence Reliable determination of the few-layer graphene oxide thickness using Raman spectroscopy.pdf Neprístupný/archív 2.2 MB 3 Vydavateľská verzia rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2016 2015 2.395 Q2 1.020 Q1
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