Počet záznamov: 1
Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy
Názov Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy Autor Naitoh Yoshitaka Spoluautori Turanský Robert 1971 SAVFYZIK - Fyzikálny ústav SAV Brndiar Ján 1980 SAVFYZIK - Fyzikálny ústav SAV RID ORCID Štich Ivan 1959 SAVFYZIK ; SAVINFO - Fyzikálny ústav SAV ORCID Spoluautori Li Yan Jun Sugawara Yasuhiro Zdroj.dok. Nature Physics. Vol. 13, no. 7 (2017), p. 663-668 Jazyk dok. eng - angličtina Krajina GB - Veľká Británia Druh dok. rozpis článkov z periodík (rbx) Ohlasy AMO, Carlos A. - PERRINO, Alma P. - PAYAM, Amir F. - GARCIA, Ricardo. Mapping Elastic Properties of Heterogeneous Materials in Liquid with Angstrom-Scale Resolution. In ACS NANO. ISSN 1936-0851, 2017, vol. 11, no. 9, pp. 8650-8659. GARRETT, Joseph L. - KRAYER, Lisa J. - PALM, Kevin J. - MUNDAY, Jeremy N. Effect of lateral tip motion on multifrequency atomic force microscopy. In APPLIED PHYSICS LETTERS. ISSN 0003-6951, 2017, vol. 111, no. 4, pp. WEYMOUTH, A. J. Non-contact lateral force microscopy. In Journal of Physics Condensed Matter. ISSN 09538984, 2017-07-17, 29, 32, pp. DIETZ, Christian. Sensing in-plane nanomechanical surface and sub-surface properties of polymers: local shear stress as function of the indentation depth. In NANOSCALE. ISSN 2040-3364, 2018, vol. 10, no. 1, pp. 460-468. OKABAYASHI, Norio - PERONIO, Angelo - PAULSSON, Magnus - ARAI, Toyoko - GIESSIBL, Franz J. Vibrations of a molecule in an external force field. In PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA. ISSN 0027-8424, 2018, vol. 115, no. 18, pp. 4571-4576. BENAGLIA, Simone - GISBERT, Victor G. - PERRINO, Alma P. - AMO, Carlos A. - GARCIA, Ricardo. Fast and high-resolution mapping of elastic properties of biomolecules and polymers with bimodal AFM. In NATURE PROTOCOLS. ISSN 1754-2189, 2018, vol. 13, no. 12, pp. 2890-2907. SEEHOLZER, T. - GRETZ, O. - GIESSIBL, F. J. - WEYMOUTH, A. J. A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. In NEW JOURNAL OF PHYSICS. ISSN 1367-2630, 2019, vol. 21, no., pp. TAN, Xinfeng - GUO, Dan - LUO, Jianbin. Different directional energy dissipation of heterogeneous polymers in bimodal atomic force microscopy. In RSC ADVANCES, 2019, vol. 9, no. 47, pp. 27464-27474. DE BEECK, Jonathan Op - FLEISCHMANN, C. - VANDERVORST, W. - PAREDIS, K. Nanoscale Localization of an Atom Probe Tip through Electric Field Mapping. In JOURNAL OF PHYSICAL CHEMISTRY C. ISSN 1932-7447, 2020, vol. 124, no. 11, pp. 6371-6378. GARCIA, Ricardo. Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications. In CHEMICAL SOCIETY REVIEWS. ISSN 0306-0012, 2020, vol. 49, no. 16, pp. 5850-5884. GRETZ, Oliver - WEYMOUTH, Alfred J. - HOLZMANN, Thomas - PURCKHAUER, Korbinian - GIESSIBL, Franz J. Determining amplitude and tilt of a lateral force microscopy sensor. In BEILSTEIN JOURNAL OF NANOTECHNOLOGY. ISSN 2190-4286, 2021, vol. 12, no., pp. 517-524. Dostupné na: https://doi.org/10.3762/bjnano.12.42. FANG, Siyuan - HU, Yun Hang. Open the door to the atomic world by single-molecule atomic force microscopy. In MATTER. ISSN 2590-2393, 2021, vol. 4, no. 4, pp. 1189-1223. Dostupné na: https://doi.org/10.1016/j.matt.2021.01.013. GISBERT, Victor G. - GARCIA, Ricardo. Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy. In ACS NANO, 2021, vol. 15, no. 12, pp. 20574-20581. ISSN 1936-0851. Dostupné na: https://doi.org/10.1021/acsnano.1c09178. TAN, Xinfeng - GUO, Dan - LUO, Jianbin. Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy. In FRICTION, 2022, vol. 10, no. 5, pp. 748-761. ISSN 2223-7690. Dostupné na: https://doi.org/10.1007/s40544-021-0489-1. YAMADA, Yuya - ICHII, Takashi - UTSUNOMIYA, Toru - KIMURA, Kuniko - KOBAYASHI, Kei - YAMADA, Hirofumi - SUGIMURA, Hiroyuki. Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy. In NANOSCALE ADVANCES, 2023, vol. 5, no. 3, pp. 840-850. ISSN 2516-0230. Dostupné na: https://doi.org/10.1039/d2na00686c. Kategória ADCA - Vedecké práce v zahraničných karentovaných časopisoch impaktovaných Kategória (od 2022) V3 - Vedecký výstup publikačnej činnosti z časopisu Typ výstupu článok Rok vykazovania 2017 Registrované v WOS Registrované v SCOPUS Registrované v CCC DOI 10.1038/nphys4083 
článok
Názov súboru Prístup Veľkosť Stiahnuté Typ Licence Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy.pdf Neprístupný/archív 1.1 MB 3 Vydavateľská verzia rok CC IF IF Q (best) JCR Av Jour IF Perc SJR SJR Q (best) CiteScore A rok vydania rok metriky IF IF Q (best) SJR SJR Q (best) 2017 2016 22.806 Q1 13.412 Q1
Počet záznamov: 1