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Thickness effect on structural defect-related density of states and crystallinity in P3HT thin films on ITO substrates

  1. NázovThickness effect on structural defect-related density of states and crystallinity in P3HT thin films on ITO substrates
    Autor Nádaždy Vojtech 1961 SAVFYZIK - Fyzikálny ústav SAV    SCOPUS    ORCID
    Spoluautori Gmucová Katarína 1955 SAVFYZIK - Fyzikálny ústav SAV    SCOPUS    ORCID

    Nádaždy Peter 1990 SAVFYZIK - Fyzikálny ústav SAV

    Šiffalovič Peter 1975 SAVFYZIK - Fyzikálny ústav SAV    ORCID

    Végso Karol 1984 SAVFYZIK - Fyzikálny ústav SAV

    Jergel Matej 1954- SAVFYZIK - Fyzikálny ústav SAV    SCOPUS    RID    ORCID

    Majková Eva 1950 SAVFYZIK - Fyzikálny ústav SAV    ORCID

    Spoluautori Schauer František
    Zdroj.dok. Journal of Physical Chemistry C. Vol. 122, no. 11 (2018), p. 5881-5887
    Jazyk dok.eng - angličtina
    KrajinaUS - Spojené štáty
    Druh dok.rozpis článkov z periodík (rbx)
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    SHAHI, Maryam - ATAPATTU, Harindi R. - BAUSTERT, Kyle N. - ANTHONY, John E. - BRILL, Joseph W. - JOHNSON, Stephen - GRAHAM, Kenneth R. Probing transport energies and defect states in organic semiconductors using energy resolved electrochemical impedance spectroscopy. In ADVANCED MATERIALS INTERFACES, 2023, vol. 10, 2202256. ISSN 2196-7350. Dostupné na: https://doi.org/10.1002/admi.202202256.
    KategóriaADCA - Vedecké práce v zahraničných karentovaných časopisoch impaktovaných
    Kategória (od 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Typ výstupučlánok
    Rok vykazovania2018
    Registrované vWOS
    Registrované vSCOPUS
    Registrované vCCC
    DOI 10.1021/acs.jpcc.7b11651
    článok

    článok

    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201820174.484Q12.135Q1
Počet záznamov: 1  

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