Počet záznamov: 1  

Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

  1. NázovMechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser
    Autor Milov Igor
    Spoluautori Makhotkin Igor

    Sobierajski Ryszard

    Medvedev Nikita

    Lipp Vladimir

    Saksl Karel 1974 SAVMATVY - Ústav materiálového výskumu SAV    SCOPUS    ORCID

    Zdroj.dok. Optics Express. Vol. 26, no. 15 (2018), p. 19665-19685
    Jazyk dok.eng - angličtina
    KrajinaUS - Spojené štáty
    Druh dok.rozpis článkov z periodík (rbx)
    OhlasyZHANG, Zhe - LI, Wenbin - HUANG, Qiushi - ZHANG, Zhong - YI, Shengzhen - PAN, Liuyang - XIE, Chun - WACHULAK, Przemyslaw - FIEDOROWICZ, Henryk - WANG, Zhanshan. A table-top EUV focusing optical system with high energy density using a modified Schwarzschild objective and a laser-plasma light source. In REVIEW OF SCIENTIFIC INSTRUMENTS. ISSN 0034-6748, 2018, vol. 89, no. 10, pp.
    LI, Wenbin - ZHANG, Zhe - PAN, Liuyang - HUANG, Qiushi - ZHANG, Zhong - YI, Shengzhen - XIE, Chun - WANG, Zhanshan. Table-top Focused EUV Optical System with High Energy Density and its Application on EUV Damage Tests. In OPTICS DAMAGE AND MATERIALS PROCESSING BY EUV/X-RAY RADIATION VII. ISSN 0277-786X, 2019, vol. 11035, no., pp.
    LI, Wenbin - PAN, Liuyang - WANG, Chunlin - ZHANG, Zhe - XIE, Chun - HUANG, Qiushi - WANG, Zhanshan. Multi-shot damage on Mo/Si multilayer induced by nanosecond EUV radiation. In AIP ADVANCES, 2021, vol. 11, no. 1, pp.
    LI, Wenbin - WANG, Chunlin - PAN, Liuyang - WU, Jiali - CAO, Jinyu - HUANG, Qiushi - XIE, Chun - WANG, Zhanshan. Damage study on Binf4/infC films using a table-top nanosecond EUV damage instrument. In Proceedings of SPIE The International Society for Optical Engineering. ISSN 0277786X, 2021-01-01, 11776, pp.
    DE HAAN, G. - VAN DEN HOOVEN, T. J. - PLANKEN, P. C. M. Ultrafast laser-induced strain waves in thin ruthenium layers. In OPTICS EXPRESS. ISSN 1094-4087, 2021, vol. 29, no. 20, pp. 32051-32067. Dostupné na: https://doi.org/10.1364/OE.438286.
    WANG ZHANSHAN - HUANG QIUSHI - ZHANG ZHONG - YI SHENGZHEN - LI WENBIN - SHEN ZHENGXIANG - QI RUNZE - YU JUN. Extreme Ultraviolet, X-Ray and Neutron Thin Film Optical Components and Systems. In ACTA OPTICA SINICA. ISSN 0253-2239, 2021, vol. 41, no. 1, pp. Dostupné na: https://doi.org/10.3788/A0S202141.0131001.
    ZHANG, Zhe - YI, Shengzhen - HUANG, Qiushi - CHEN, Shenghao - LI, Wenbin - ZHANG, Zhong - WANG, Zhanshan. Research progress of normal-incidence optical system at extreme ultraviolet(EUV)wavelength. In Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2022-11-01, 30, 21, pp. 2678-2687. ISSN 1004924X. Dostupné na: https://doi.org/10.37188/OPE.20223021.2678.
    LI, Wenbin - LI, Shuhui - PAN, Liuyang - ZHANG, Zhe - XIE, Chun - HUANG, Qiushi - WANG, Zhanshan. Nanosecond extreme ultraviolet radiation damage on thin film mirrors. In Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 2022-11-01, 30, 21, pp. 2698-2710. ISSN 1004924X. Dostupné na: https://doi.org/10.37188/OPE.20223021.2698.
    PAN, Liuyang - LI, Shuhui - CAO, Jinyu - WU, Jiali - ZHANG, Zhe - WANG, Kun - HUANG, Qiushi - MA, Bin - LI, Wenbin - WANG, Zhanshan. Ultrafast Time-Resolved Pump-Probe Investigation of Nanosecond Extreme Ultraviolet-Light-Induced Damage Dynamics on Binf4/infC/Ru Nano-Bilayer Film. In Nano Letters, 2022-07-13, 22, 13, pp. 5260-5268. ISSN 15306984. Dostupné na: https://doi.org/10.1021/acs.nanolett.2c01171.
    KategóriaADCA - Vedecké práce v zahraničných karentovaných časopisoch impaktovaných
    Kategória (od 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Typ výstupučlánok
    Rok vykazovania2018
    Registrované vWOS
    Registrované vSCOPUS
    Registrované vCCC
    DOI 10.1364/OE.26.019665
    článok

    článok

    Názov súboruPrístupVeľkosťStiahnutéTypLicence
    Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.pdfPrístupný3.9 MB2Vydavateľská verzia
    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    201820173.356Q11.519Q1
Počet záznamov: 1  

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