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Scanning thermal microscopy for accurate nanoscale device thermography

  1. NázovScanning thermal microscopy for accurate nanoscale device thermography
    Autor Gucmann Filip 1987 SAVELEK - Elektrotechnický ústav SAV    ORCID
    Spoluautori Pomeroy J.W.

    Kuball M.

    Zdroj.dok. Nano Today. Vol. 39 (2021), no. 101206
    Jazyk dok.eng - angličtina
    Druh dok.rozpis článkov z periodík (rbx)
    OhlasyFUJII, Shintaro - SHOJI, Yoshiaki - FUKUSHIMA, Takanori - NISHINO, Tomoaki. Visualization of Thermal Transport Properties of Self-Assembled Monolayers on Au(111) by Contact and Noncontact Scanning Thermal Microscopy. In JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2021, vol. 143, no. 44, pp. 18777-18783. ISSN 0002-7863. Dostupné na: https://doi.org/10.1021/jacs.1c09757.
    SUN, L. - WANG, W.H. - JIANG, P. - BAO, X.H. Nanoscale thermometry under ambient conditions via scanning thermal microscopy with 3D scanning differential method. In REVIEW OF SCIENTIFIC INSTRUMENTS. ISSN 0034-6748, NOV 1 2022, vol. 93, no. 11. Dostupné na: https://doi.org/10.1063/5.0107102.
    LI, Y.F. - ZHANG, Y. - LIU, Y.C. - XIE, H.Q. - YU, W. A Comprehensive Review for Micro/Nanoscale Thermal Mapping Technology Based on Scanning Thermal Microscopy. In JOURNAL OF THERMAL SCIENCE. ISSN 1003-2169, JUL 2022, vol. 31, no. 4, SI, p. 976-1007. Dostupné na: https://doi.org/10.1007/s11630-022-1654-1.
    LI, Shaoying - CHEN, Na - LIU, Zhenmin - LIU, Shupeng - SHANG, Yana - LIU, Yong - CHEN, Zhenyi - PANG, Fufei - WANG, Tingyun. Temperature measurement and scanning thermal imaging in micro-nano region with near-field optical fiber probe. In Proceedings 28th International Conference on Optical Fiber Sensors, OFS 2023, 2023-01-01, pp. Dostupné na: https://doi.org/10.1364/OFS.2023.W6.2.
    LIU, Zhenmin - CHEN, Na - LI, Shaoying - LIU, Yong - SHANG, Yana - CHEN, Zhenyi - PANG, Fufei - WANG, Tingyun. Ultrafast Near Field Temperature Measurement Method Based on Micro-nano FBG Probe with TS-DFT. In Proceedings 28th International Conference on Optical Fiber Sensors, OFS 2023, 2023-01-01, pp. Dostupné na: https://doi.org/10.1364/OFS.2023.w2.3.
    MORADI, A. - SZEWCZYK, P.K. - STACHEWICZ, U. Bridging a Gap in Thermal Conductivity and Heat Transfer in Hybrid Fibers and Yarns via Polyimide and Silicon Nitride Composites. In SMALL. ISSN 1613-6810, DEC 2023, vol. 19, no. 52. Dostupné na: https://doi.org/10.1002/smll.202305104.
    LIU, Z.M. - CHEN, N. - LI, S.Y. - LIU, Y. - SHANG, Y. - CHEN, Z.Y. - PANG, F.F. - WANG, T.Y. Modeling and calibration of micro/nano FBG temperature probe for scanning probe microscopy. In OPTICS EXPRESS. ISSN 1094-4087, JUN 5 2023, vol. 31, no. 12, p. 19453-19462. Dostupné na: https://doi.org/10.1364/OE.491821.
    OHAYON-LAVI, A. - SHACHAR-MICHAELY, G. - KORONIO, E. - KELLER, Y. - YALON, E. - ZISKIND, G. - REGEV, O. Graphene-based conformal coating for heat dissipation on printed circuit boards. In APPLIED THERMAL ENGINEERING. ISSN 1359-4311, JUL 5 2023, vol. 229. Dostupné na: https://doi.org/10.1016/j.applthermaleng.2023.120562.
    ZHANG, Q.Q. - ZHU, W. - ZHOU, J. - DENG, Y. Realizing the Accurate Measurements of Thermal Conductivity over a Wide Range by Scanning Thermal Microscopy Combined with Quantitative Prediction of Thermal Contact Resistance. In SMALL. ISSN 1613-6810, AUG 9 2023, vol. 19, no. 32. Dostupné na: https://doi.org/10.1002/smll.202300968.
    NAM, K. - KIM, H. - PARK, W. - AHN, J.S. - CHOI, S. Probing the optical near-field of plasmonic nano structure using scanning thermal microscopy. In NANOTECHNOLOGY. ISSN 0957-4484, MAR 5 2023, vol. 34, no. 10. Dostupné na: https://doi.org/10.1088/1361-6528/aca90f.
    ALIKIN, D. - ZAKHARCHUK, K. - XIE, W.J. - ROMANYUK, K. - PEREIRA, M.J. - ARIAS-SERRANO, B.I. - WEIDENKAFF, A. - KHOLKIN, A. - KOVALEVSKY, A.V. - TSELEV, A. Quantitative Characterization of Local Thermal Properties in Thermoelectric Ceramics Using "Jumping-Mode" Scanning Thermal Microscopy. In SMALL METHODS. ISSN 2366-9608, APR 2023, vol. 7, no. 4. Dostupné na: https://doi.org/10.1002/smtd.202201516.
    KategóriaADCA - Vedecké práce v zahraničných karentovaných časopisoch impaktovaných
    Kategória (od 2022)V3 - Vedecký výstup publikačnej činnosti z časopisu
    Typ výstupučlánok
    Rok vykazovania2021
    Registrované vWOS
    Registrované vSCOPUS
    Registrované vCCC
    DOI 10.1016/j.nantod.2021.101206
    článok

    článok

    Názov súboruPrístupVeľkosťStiahnutéTypLicence
    Scanning thermal microscopy for accurate nanoscale_supplem.pdfPrístupný596 KB1Autorský preprint
    Scanning thermal microscopy for accurate nanoscale.pdfPrístupný1.3 MB1Autorský preprint
    Scanning thermal microscopy for accurate nanoscale device.pdfNeprístupný/archív107 KB3Vydavateľská verzia
    rokCCIFIF Q (best)JCR Av Jour IF PercSJRSJR Q (best)CiteScore
    A
    rok vydaniarok metrikyIFIF Q (best)SJRSJR Q (best)
    2021202020.722Q15.586Q1
Počet záznamov: 1  

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